llcontrol-core shared definitions. More...

Defines
#define	HOST_TIMING 1
#define	IGNORE_COUNTER_STOP 0
#define	POLLALERT(ipoll, message) if ( (++ipoll&0xfffff) == 0 ) fprintf( stderr, message )
#define	INIT_TIMER get_elapsed_microseconds(1)
#define	MARK_TIME(t, ident)
#define	FOREACHCARD_MARK_TIME(t, ident) FOREACHCARD{ MARK_TIME(t, ident); }
#define	TIMER_CHECK_OVERFLOW if (get_elapsed_microseconds(0) > 99000) INIT_TIMER
Functions
void	appEnterLLC_SYNC_ECM (int icard, struct MU mu, struct TestDescription td)
	set up LLCV2_INIT buffer and enter mode.
int	runSYNC_ECM (struct TestDescription *td, int soft_clock)
	runs the test SYNC_ECM mode.
void	appEnterLLC_SYNC_2V (int icard, struct MU mu, struct TestDescription td)
	set up LLCV2_INIT buffer and enter mode.
int	runSYNC_2V (struct TestDescription *td, int soft_clock)
	runs the test SYNC_2V mode.
void	appEnterLLC_SYNC_2VAO32 (int icard, struct MU mu, struct TestDescription td)
	set up LLCV2_INIT buffer and enter mode.
void	appEnterLLC_SYNC_2VRFM (void)
	set up LLCV2_INIT buffer and enter mode.
int	runSYNC_2VAO32 (struct TestDescription *td, int soft_clock)
	runs the test SYNC_2V mode.
int	runSYNC_2VRFM (struct TestDescription *td, int soft_clock)
	runs the test SYNC_2V mode.
int	runSCM216 (struct TestDescription *td)
u32	commandModifiers (struct TestDescription *td)
static void	updateTargetAddr (u32 cmd, struct Card *card, unsigned offset)
static void *	td_get_next_dac_data (struct TestDescription *td)
void	doApplicationWork (struct TestDescription *td, u32 offset)
void	initV2Stats (struct TestDescription *td)
void	v2_updateTstats (u32 cmd, struct Card card, struct TimingStats tstats)
	updates timing stats from embedded host buffer data
u32	card_v2_WaitDmaDone (struct Card *card)
	updates timing stats from embedded host buffer data
Variables
void(*	updateTstats )(u32 cmd, struct Card card, struct TimingStats tstats)
	virtual function to retrieve timing stats.
u32(*	waitDmaDone )(struct Card *c)
	virtual function to block until DMA done.
int	user_abort

Detailed Description

llcontrol-core shared definitions.

Definition in file llcontrol-core.h.

Define Documentation

#define FOREACHCARD_MARK_TIME	(	t,
		ident
	)		FOREACHCARD{ MARK_TIME(t, ident); }

Definition at line 59 of file llcontrol-core.h.

Referenced by do_run(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), and runSYNC_ECM().

#define HOST_TIMING 1

Definition at line 38 of file llcontrol-core.h.

#define IGNORE_COUNTER_STOP 0

Definition at line 39 of file llcontrol-core.h.

#define INIT_TIMER get_elapsed_microseconds(1)

Definition at line 55 of file llcontrol-core.h.

#define MARK_TIME	(	t,
		ident
	)

Value:

do { \
        tstats[icard].test_points[t] = get_elapsed_microseconds(0);\
        } while(0)

Definition at line 56 of file llcontrol-core.h.

Referenced by do_run(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), and runSYNC_ECM().

#define POLLALERT	(	ipoll,
		message
	)		if ( (++ipoll&0xfffff) == 0 ) fprintf( stderr, message )

Definition at line 41 of file llcontrol-core.h.

Referenced by do_run(), runSCM216(), runSYNC_2V(), runSYNC_2VAO32(), and runSYNC_ECM().

#define TIMER_CHECK_OVERFLOW if (get_elapsed_microseconds(0) > 99000) INIT_TIMER

Definition at line 60 of file llcontrol-core.h.

Function Documentation

void appEnterLLC_SYNC_2V	(	int	icard,
		struct MU *	mu,
		struct TestDescription *	td
	)

set up LLCV2_INIT buffer and enter mode.

Buffer set up as 4K block at offset 0

Todo:

this overwrites settings from initV2Stats(), initV2Stats is therefore redundant.

set up for single 4K buffer

uses V2 synchronization

Definition at line 90 of file llcontrol-sync2v-core.c.

References TestDescription::arg, TestDescription::cards, TestDescription::channels, TestDescription::clkpos, commandModifiers(), TestDescription::ARG::divisor, EACHBUF, enterLLC_SYNC_ECM(), getBusAddr(), getVaddr(), TestDescription::internal_loopback, LLCV2_AI_HSBT, llcv2_hb_offset, PRINTF, short, Card::sync_2v_offset_status_hsbt, Card::tlatch, TestDescription::trpos, updateTstats, and waitDmaDone.

Referenced by runTest().

void appEnterLLC_SYNC_2VAO32	(	int	icard,
		struct MU *	mu,
		struct TestDescription *	td
	)

set up LLCV2_INIT buffer and enter mode.

Buffer set up as 4K block at offset 0

Todo:

this overwrites settings from initV2Stats(), initV2Stats is therefore redundant.

set up for single 4K buffer

uses V2 synchronization

Definition at line 168 of file llcontrol-sync2VAO32-core.c.

References TestDescription::ao32_count, TestDescription::ao32_ids, TestDescription::arg, BP_FC_SET_LLCV2_INIT, TestDescription::cards, TestDescription::channels, TestDescription::clkpos, TestDescription::ARG::divisor, EACHBUF, enterLLC_SYNC_ECM(), getBusAddr(), getSlavePa(), getVaddr(), TestDescription::internal_loopback, LLCV2_AI_HSBT, llcv2_hb_offset, LLCV2_INIT_AO32PA0, MASTER, PRINTF, short, Card::sync_2v_offset_status_hsbt, Card::tlatch, TestDescription::trpos, updateTstats, and waitDmaDone.

Referenced by runTest().

void appEnterLLC_SYNC_2VRFM ( void )

set up LLCV2_INIT buffer and enter mode.

Buffer set up as 4K block at offset 0

Todo:

this overwrites settings from initV2Stats(), initV2Stats is therefore redundant.

Definition at line 90 of file llcontrol-sync2VRFM-core.c.

Referenced by runTest().

void appEnterLLC_SYNC_ECM	(	int	icard,
		struct MU *	mu,
		struct TestDescription *	td
	)

set up LLCV2_INIT buffer and enter mode.

Buffer set up as 4K block at offset 0

Todo:

this overwrites settings from initV2Stats(), initV2Stats is therefore redundant.

set up for single 4K buffer

uses V2 synchronization

Definition at line 56 of file llcontrol-syncECM-core.c.

References TestDescription::arg, TestDescription::clkpos, commandModifiers(), TestDescription::ARG::divisor, EACHBUF, enterLLC_SYNC_ECM(), getBusAddr(), getVaddr(), TestDescription::internal_loopback, llcv2_hb_offset, TestDescription::trpos, updateTstats, and waitDmaDone.

Referenced by runTest().

u32 card_v2_WaitDmaDone ( struct Card * card )

updates timing stats from embedded host buffer data

Definition at line 297 of file llcontrol-core.c.

References Card::buf, getVaddr(), LLCV2_OFFSET_STATUS_HSBT, llv2WaitDmaDone(), and Card::mbx.

u32 commandModifiers ( struct TestDescription * td )

Definition at line 553 of file llcontrol-core.c.

References LLCV2_INIT_MAGIC_MARKER, LLCV2_INIT_MARKER, and TestDescription::V2_BUFS.

Referenced by appEnterLLC_SYNC_2V(), appEnterLLC_SYNC_ECM(), and runTest().

void doApplicationWork	(	struct TestDescription *	td,
		u32	offset
	)

Definition at line 276 of file llcontrol-core.c.

References EACHBUF, FOREACHCARD, getVaddr(), icard, TestDescription::iter, td_sample_size(), and TestDescription::work_buf.

Referenced by do_run(), runSYNC_2V(), runSYNC_2VAO32(), runSYNC_2VRFM(), and runSYNC_ECM().

void initV2Stats ( struct TestDescription * td )

Todo:: could be set by a signal

Definition at line 874 of file llcontrol-core.c.

int runSCM216 ( struct TestDescription * td )

runs the test SCM mode, ACQ216 only. PSEUDO-CODE:

(1) Clear the latch timer
(2) Set a local memory target address and arm the capture
(3) Poll for counter running (hardware counter starts on external gate)
(4) Iterate for required number of samples:
(5) [optionally send a soft clock command] trigger an acquisition
(6) Wait for DMA Done - at this point data is available in target mem. A "real" control application is probably getting most of its calcs done here rather than simply polling
(7) [Get the latch (sample) and current uSec counters from the boards - only if interested]
(8) Check the process has not stopped (external gate high)
(9) [optionally update the target address - else it gets overwritten]

Definition at line 100 of file llcontrol-acq216-core.c.

References BP_MB_A4, TestDescription::decimation, TestDescription::do_work, doApplicationWork216(), EACHBBB, EACHBUF, EACHCARD, EACHMBX, FIRSTMBX, FOREACHCARD, FOREACHCARD_MARK_TIME, G_quit, getBusAddr(), getMboxPollcount(), getVaddr(), TestDescription::hardware_gate_off, TimingStats::hb_poll, TestDescription::hb_polling, hbPoll(), hbPrimePoll(), icard, TestDescription::iter, TestDescription::iterations, TestDescription::llc200_init_count, LLC_CSR_M_ARM, LLC_CSR_M_SOFTCLOCK, LLC_MAKE_DECIM, llCounterRunning(), llSetCmd(), llSetTlatch(), MARK_TIME, TestDescription::min_latency_test, TestDescription::overwrite, POLLALERT, POLLOFF, PRAMS_OFFSET, TestDescription::sample_offset, setAcq216Parameters(), setMbox(), TestDescription::stats_buf, TimingStats::target_poll, td_sample_size(), THIS_CARD, TimingStats::tlatch, TestDescription::tlog, updateTargetAddr(), updateTimingStats(), updateTstats, user_abort, and waitDmaDone.

Referenced by runTest().

int runSYNC_2V	(	struct TestDescription *	td,
		int	soft_clock
	)

runs the test SYNC_2V mode.

PSEUDO-CODE:

(1) Clear the latch timer
(2) Set a local memory target address and arm the capture
(3) Poll for counter running (hardware counter starts on external gate)
(4) Iterate for required number of samples:
(5) [optionally send a soft clock command] trigger an acquisition
(6) Wait for DMA Done - at this point data is available in target mem. A "real" control application is probably getting most of its calcs done here rather than simply polling
(7) [Get the latch (sample) and current uSec counters from the boards - only if interested]
(8) Check the process has not stopped (external gate high)
(b) write data to host side buffer(LLCV2_AO_HSBS)
(b.1) take the incoming value on feedback_channel and propagate to all DACS. default is to assume HAWG on DAC0 (so feedback_channel better be 0 !), but td->update_dacs makes a better test.
(b.15) special case where we are DRIVING the initial DAC signal from host side.
(b.2) simple feedforward case - just drive all DACS from AWG pattern.

(b.2)

Definition at line 127 of file llcontrol-sync2v-core.c.

References DAC_COUNT, TestDescription::decimation, TestDescription::do_work, doApplicationWork(), EACHBBB, EACHBUF, EACHCARD, EACHDAC_BASE, EACHDAC_BASE16, EACHMBX, TestDescription::feedback, TestDescription::feedback_channel, FIRSTBUF, FIRSTMBX, FOREACHCARD, FOREACHCARD_MARK_TIME, G_quit, getBusAddr(), getMboxPollcount(), getVaddr(), TestDescription::hardware_gate_off, icard, TestDescription::iter, TestDescription::iterations, LLC_CSR_M_ARM, LLC_CSR_M_SOFTCLOCK, LLC_MAKE_DECIM, llCounterRunning(), LLCV2_AO_HSBS, llSetCmd(), llSetTlatch(), llv2InitDmaDone(), MARK_TIME, memset32(), TestDescription::min_latency_test, OFFSET, POLLALERT, PRINTF, TestDescription::stats_buf, TimingStats::target_poll, td_get_next_dac_data(), TimingStats::tlatch, TestDescription::tlog, TestDescription::update_dacs, updateTargetAddr(), updateTimingStats(), updateTstats, V2SETDACS, and waitDmaDone.

Referenced by runTest().

int runSYNC_2VAO32	(	struct TestDescription *	td,
		int	soft_clock
	)

runs the test SYNC_2V mode.

PSEUDO-CODE:

(1) Clear the latch timer
(2) Set a local memory target address and arm the capture
(3) Poll for counter running (hardware counter starts on external gate)
(4) Iterate for required number of samples:
(5) [optionally send a soft clock command] trigger an acquisition
(6) Wait for DMA Done - at this point data is available in target mem. A "real" control application is probably getting most of its calcs done here rather than simply polling
(7) [Get the latch (sample) and current uSec counters from the boards - only if interested]
(8) Check the process has not stopped (external gate high)
(b) write data to host side buffer(LLCV2_AO_HSBS)
(b.1) take the incoming value on feedback_channel and propagate to all DACS. default is to assume HAWG on DAC0 (so feedback_channel better be 0 !), but td->update_dacs makes a better test. NB: Feedback is on RTMAO, not AO32CPCI
(b.15) special case where we are DRIVING the initial DAC signal from host side.
(b.2) simple feedforward case - just drive all DACS from AWG pattern.

(b.2)

AO32 update: apply to MASTER only

Definition at line 213 of file llcontrol-sync2VAO32-core.c.

References TestDescription::ao32_count, BASE_AO32, DAC_COUNT, TestDescription::decimation, TestDescription::do_work, doApplicationWork(), EACHBBB, EACHBUF, EACHCARD, EACHDAC_BASE, EACHDAC_BASE16, EACHMBX, TestDescription::feedback, TestDescription::feedback_channel, FIRSTBUF, FIRSTMBX, FOREACHCARD, FOREACHCARD_MARK_TIME, G_quit, getBusAddr(), getMboxPollcount(), getVaddr(), TestDescription::hardware_gate_off, icard, TestDescription::iter, TestDescription::iterations, LLC_CSR_M_ARM, LLC_CSR_M_SOFTCLOCK, LLC_MAKE_DECIM, llCounterRunning(), LLCV2_AO_HSBS, llSetCmd(), llSetTlatch(), llv2InitDmaDone(), MARK_TIME, memset32(), TestDescription::min_latency_test, OFFSET, POLLALERT, PRINTF, setSlaveData(), TestDescription::stats_buf, TimingStats::target_poll, td_get_next_dac_data(), THIS_CARD, TimingStats::tlatch, TestDescription::tlog, TestDescription::update_dacs, updateTargetAddr(), updateTimingStats(), updateTstats, V2SETDACS, and waitDmaDone.

Referenced by runTest().

int runSYNC_2VRFM	(	struct TestDescription *	td,
		int	soft_clock
	)

runs the test SYNC_2V mode.

PSEUDO-CODE:

(1) Clear the latch timer
(2) Set a local memory target address and arm the capture
(3) Poll for counter running (hardware counter starts on external gate)
(4) Iterate for required number of samples:
(5) [optionally send a soft clock command] trigger an acquisition
(6) Wait for DMA Done - at this point data is available in target mem. A "real" control application is probably getting most of its calcs done here rather than simply polling
(7) [Get the latch (sample) and current uSec counters from the boards - only if interested]
(8) Check the process has not stopped (external gate high)
(b) write data to host side buffer(LLCV2_AO_HSBS)
(b.1) take the incoming value on feedback_channel and propagate to all DACS. default is to assume HAWG on DAC0 (so feedback_channel better be 0 !), but td->update_dacs makes a better test.
(b.15) special case where we are DRIVING the initial DAC signal from host side.
(b.2) simple feedforward case - just drive all DACS from AWG pattern.

Definition at line 99 of file llcontrol-sync2VRFM-core.c.

References TestDescription::decimation, TestDescription::do_work, doApplicationWork(), EACHCARD, EACHMBX, G_quit, getMboxPollcount(), icard, TestDescription::iter, TestDescription::iterations, LLC_MAKE_DECIM, MARK_TIME, TestDescription::min_latency_test, TestDescription::stats_buf, TimingStats::target_poll, TimingStats::tlatch, TestDescription::tlog, updateTimingStats(), updateTstats, and waitDmaDone.

Referenced by runTest().

int runSYNC_ECM	(	struct TestDescription *	td,
		int	soft_clock
	)

runs the test SYNC_ECM mode.

PSEUDO-CODE:

(1) Clear the latch timer
(2) Set a local memory target address and arm the capture
(3) Poll for counter running (hardware counter starts on external gate)
(4) Iterate for required number of samples:
(5) [optionally send a soft clock command] trigger an acquisition
(6) Wait for DMA Done - at this point data is available in target mem. A "real" control application is probably getting most of its calcs done here rather than simply polling
(7) [Get the latch (sample) and current uSec counters from the boards - only if interested]
(8) Check the process has not stopped (external gate high)
(b) write data to host side buffer(LLCV2_AO_HSBS)
(b.1) take the incoming value on feedback_channel and propagate to all DACS. default is to assume HAWG on DAC0 (so feedback_channel better be 0 !), but td->update_dacs makes a better test.
(b.15) special case where we are DRIVING the initial DAC signal from host side.
(b.2) simple feedforward case - just drive all DACS from AWG pattern.